MAWPS: A Math Word Problem Repository. Rik Koncel-Kedziorski**, Subhro Roy**, Aida Amini, Nate Kushman and Hannaneh Hajishirzi. NAACL 2016 (Short). The system is live ...
Abstract: In sub-28-nm nodes, existing optical critical dimension (OCD) metrology tools are challenging to simultaneously and thoroughly meet the metrology requirements of the wafer-level ...
About An Inverse Problem in Estimation of Interfacial Heat Transfer Coefficient during Two-Dimensional Solidification of Al 5%Wt-Si based on Particle Swarm Optimization ...
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